The Information Technology, Sensors, and Control Systems (ITSC) Technical Community judges select the top papers from the ITSC community that will be presented at the annual international meeting (AIM) each year. To be considered, authors must submit their paper to headquarters by April 22 to be eligible for that year's AIM.

2018 Winners
Detection of Surface and Subsurface Defects of Apples Using Structured-Illumination Reflectance Imaging with Machine Learning Algorithms
Yuzhen Lu, Renfu Lu

3D Computer Vision and Machine Learning Based Technique for High Throughput Cotton Boll Mapping Under Field Conditions
Shangpeng Sun, Changying Li, Andrew H. Paterson, Yu Jiang, Jon S. Robertson